Advanced Surface Processes

Our scanning electron microscope (SEM) is capable of resolving and measuring features down to 3nm in high vacuum, 4nm in low vacuum, and captures digital image files of the areas of interest.  Our system can accommodate samples both conductive and non-conductive, up to 2lb in weight. Because our system is capable of operating at low vacuum, we can image a wide variety of samples.  Images can be obtained from multiple viewing angles, including normal to the surface and off-axis to capture detailed surface topography.

Energy dispersive x-ray spectroscopy (EDS) identifies the elemental makeup of the features in the microscope's field of view.  The silicon drift detector EDS system provides spectra and area maps showing elemental identification, composition, distribution, and line profiles.  Selected applications include additive manufacturing, battery technology, energy generation, semiconductor microelectronics, and oil and gas.