Scanning Electron Microscope (SEM) Imaging and
Energy Dispersive X-ray Spectroscopy (EDS)
Our scanning electron microscope (SEM) is capable of resolving and measuring features down to 3nm in high vacuum, 4nm in low vacuum, and captures digital image files of the areas of interest. Our system can accommodate samples both conductive and non-conductive, up to 2lb in weight. Because our system is capable of operating at low vacuum, we can image a wide variety of samples. Images can be obtained from multiple viewing angles, including normal to the surface and off-axis to capture detailed surface topography.
Energy dispersive x-ray spectroscopy (EDS) identifies the elemental makeup of the features in the microscope's field of view. The silicon drift detector EDS system provides spectra and area maps showing elemental identification, composition, distribution, and line profiles.
Our sample preparation services include sample size reduction, diamond wire saw cross-sectioning, ion beam polishing, and gold and carbon coating on non-conducting samples to improve image contrast and quality. Specialized mounting requirements can be met in-house.
We have over 20 years of experience evaluating materials for failure analysis, composition, and morphology. We are located just outside of Albuquerque, New Mexico. Our intent is to provide quick turnaround on analysis requests from customers in the southwest.
Albuquerque, New Mexico, United States
Mon | 09:00 am – 05:00 pm | |
Tue | 09:00 am – 05:00 pm | |
Wed | 09:00 am – 05:00 pm | |
Thu | 09:00 am – 05:00 pm | |
Fri | 09:00 am – 05:00 pm | |
Sat | Closed | |
Sun | Closed |
Closed major holidays
Hours listed are in the Mountain time zone
We use cookies to analyze website traffic and optimize your website experience. By accepting our use of cookies, your data will be aggregated with all other user data.